Nixon Peabody’s annual CLE seminar for corporate counsel and other legal executives with oversight of Intellectual Property will include cutting-edge legal topics impacting your organization’s management of its intellectual property and its business. Jeff Stec will be presenting on the topic, ” Recent trends and developments in patent and trademark damages ”
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Econometrics for Intellectual Property disputes
What is econometrics? Econometrics is the application of statistical methods to economic and financial data, utilized for quantifying and rebutting economic...