Nixon Peabody’s annual CLE seminar for corporate counsel and other legal executives with oversight of Intellectual Property will include cutting-edge legal topics impacting your organization’s management of its intellectual property and its business. Jeff Stec will be presenting on the topic, ” Recent trends and developments in patent and trademark damages ”
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The comparability challenges patent damages experts face
In August, in MLC Intellectual Property LLC v. Micron Technology Inc., the US Court of Appeals for the Federal Circuit affirmed a district court’s ruling to...