Jeff Stec is a panelist on this topic. They will analyze the implications of Samsung v. Apple ruling. The speakers will also provide the audience with an in-depth discussion of the recent trends and developments shaping the Design Patent Damages landscape.
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The comparability challenges patent damages experts face
In August, in MLC Intellectual Property LLC v. Micron Technology Inc., the US Court of Appeals for the Federal Circuit affirmed a district court’s ruling to...